Mireia was part of a multidisciplinary team (ECN, Philips, Holland Innovative) that was successful in developing a new/improved method for reliability testing of solar panels (thin film), specifically humidity ingress test. In this project a new in-situ technique to monitor module degradation during this (or any) accelerated test, was also developed: the module is exposed to extreme conditions of humidity and temperature during a certain time (weeks, months), and the module degradation in time is measured in situ.
The combination of technical knowledge from the research institutes and DfSS methodology was key for the fast qualification of the newly developed tests and measurement systems. This new reliability test saves vital time (1-2 months) for new process introduction to market. Mireia was responsible for test specification definition, experimental design (DoE) and extensive data analysis.

with: Holland Innovative and ECN

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